Time between other failures (Mother)

MOTHER = Mean time between failure caused by phenomena other than the test

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Protected function (Mted)

MTED = Mean time between failure for the protected function

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Allowed time between multiple failures (Mmf)

MMF = Allowed mean time between multiple failures

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Unavailability caused by the testing process (p)

p = if P is the probability that the failure finding test will leave the device in a failed state, p (as a decimal) is the unavailability caused by the testing process

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Number of parallel protective devices (n)

n = the number of parallel protective devices

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